Carac Symposium, supported by Nanoelec/Characterisation program and its attached PAC-G platform, is the annual event dedicated to characterisation techniques that fit to electronics domain and beyond. Characterisation of new electronic components is essential to their design and ultimately to ensure their reliability.

The increasing complexity of electronic components and technologies, as well as the diversification of materials and manufacturing processes in the More-than-Moore approach require characterisation that exceeds the performance of conventional laboratory equipment.

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